Electrical, electromechanical and electrocaloric measurements

Device for charge (charge amplifier) and deformation (fiber-optic sensor) measurements as a function of electric field from room temperature to 400 °C (possibility of harmonic analysis using lock-in techniques)

Impedance analyzer
(Bode 100, Omicron Lab)

Setup for measuring temperature and frequency dependence of dielectric permittivity of ceramics and thick films in the temperature range between 25oC and 500 °C

Atomic force microscopy (AFM), piezo-force microscopy (PFM), conductive-force microscopy (CAFM), Kelvin-probe force microscopy (KPFM), electrostatic-force microscopy (EFM), magnetic-force microscopy (MFM) and scanning thermal microscopy (SThM) 
(MFP-3D, Asylum Reasearch)
Co-funder CoE NAMASTE

Electrical characterization of piezoelectric ceramics in temperature range from -100 °C to 600 °C
(Aixacct PES)

Impendance analyzer
(SI 1260, Solartron)

Quan-tech noise-meter
(Model 315C, Quan-tech))

Berlincourt Piezo Test System
(PM10, Take Control)

Ceramic and thick-film poling unit

Setup for measuring temperature and frequency dependence of dielectric permittivity of thin films in temperature range between -170 °C and 330 °C

Measurement system for characterization of electrocaloric temperature changes of materials at room temperature

Measurement system for characterization of electrocaloric temperature changes of materials in the temperature range between -50 °C and 150 °C

Low-frequency (100-0.002 Hz) dielectric permittvity measurements in thetemperature range between 25 °C and 400 °C

Magnetron sputtering equipment
(5Pascal)